OMICRON electronics

Transducer Testing

In high and medium-high voltage networks, transducers form the metrological basis for the acquisition of electrical parameters. All switching operations, such as the demand for additional power plant capacity via the dispatch center, are based on these measurements. Just as important are regular calibrations of the transducers shared across the entire network in the network nodes.

Thanks to the high degree of accuracy of their test statistics and the DC measuring input, OMICRON’s CMC 256plus and CMC 156 EP are the ideal tools for the reliable calibration of any type of transducer.



Learn more about OMICRON's solutions in the area of Transducer Testing
CMC 256plus
CMC 256plus - High precision test set and universal calibrator

CMC 256plus - High precision test set and universal calibrator

OMICRON’s test system and universal calibrator
CMC 256plus has high-precision DC measuring inputs
(20 mA, 10 V) and with its current and voltage sources provides any desired electrical input quantities for transducers. The “Transducer” software module supports the manual output of test quantities, required when adjusting a test subject, and automatic testing with a number of test points across the entire input range. Any deviations are calculated immediately and stated as device error in percentage (based on the final value in the range) in the test report.  

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CMC 156 EP
CMC 156 EP - High precision three-phase protection test set and calibrator

CMC 156 EP - High precision three-phase protection test set and calibrator

Equipped with the EP (Extended Precision) hardware option, the CMC 156 is the ideal instrument for testing transducers. The high degree of accuracy of its output quantities and the DC measuring input allow the reliable calibration of any type of transducer. The “Transducer” software module supports the manual output of test quantities, required when adjusting a test subject, and automatic testing with a number of test points across the entire input range. Any deviations are calculated immediately and stated as device error in percentage (based on the final value in the range) in the test report.

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