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OMICRON Control Center
OMICRON´s software modules feature comprehensive functionality for conventional manual or automatic testing. Unique, however, are the automation possibilities the OMICRON Control Center offers. Comprehensive test plans can easily be built, maintained and distributed; testing times can be significantly reduced. With the OMICRON Control Center (OCC) technology all functions of a test object can be tested with one test plan, defined within an OCC document.
Basically, an OCC document comprises the following elements:
Test Object Data | Defined in XRIO, a powerful test object environment to describe/model all test object parameters and settings. Test object data can be entered manually or may be imported. XRIO Converters make the setting transfer from the relay to the test software fast and easy. |
Information on the device(s), outputs and inputs, wiring connections | Specified in Hardware Configuration Component (HCC). Present throughout a test plan for all embedded test functions/modules. |
Test modules with test settings (test points, etc.) | Number and type of embedded test modules depending on the complexity of the tests to be performed. With the LinkToXRIO technology, all "general" test modules have access to the XRIO parameters and allow the definition of test settings relative to test object parameters. Tests automatically adapt to changed test object settings. |
Optional: Graphics, instruction texts, etc. | Guides the tester through the testing process according to test specifications (connection diagrams, check instructions, etc.) supported by Pause Module, Text View, ExeCute. |
Results (after testing) | Contains all test results in secure format with exact data, automatic assessment of the test points according to tolerances, automatically created test report (customizable to meet the organization´s requirements). |
To adapt a test plan for a certain parameter, only this single parameter needs to be changed in XRIO – all test settings adapt automatically, as they are set relative to the device parameters.
Re-usability
OCC documents can easily be used as templates for the same or similar tests: Simply copying the OCC file, deleting the results of the previous test and restarting will perform the test again with the exact same settings, configuration, and test specifications. For similar tests, where only the parameterization differs (e.g. in substations with several feeders), simple copying of the OCC file and adjustment of the parameters is all that is required.
Test Wizard, an efficient and customizable tool for the automatic generation of optimized Control Center test plans, completes OMICRON´s “toolbox” for automatic testing and test plan creation.
External post-processing
Data export as CSV or universal XML format with Schema information allows special-purpose external post-processing of the gathered test data, such as database archiving, statistics calculations, trend analysis or automated test benches. Several step-by-step examples are provided in the Manuals section of the software.