Content right column
The Sampled Values Configuration Module configures a CMC test set for publishing Sampled Values streams according to IEC 61850-9-2
Sampled Values Configuration Module
The Sampled Value Configuration module sets up the generation of sampled values in the CMC test set. It provides the communication parameters and enables, or disables, the sampled values outputs. To facilitate parameter entry and to avoid typing errors, the parameters can be imported from configuration files in the standardized SCL (Substation Configuration Language) format.
Features & Benefits
CMC 256/356 test sets generate sampled values according to the "Implementation Guideline for Digital Interface to Instrument Transformers using IEC 61850-9-2", which is published by the UCA International Users Group. As this implementation guideline defines a subset of IEC 61850-9-2, it is commonly referred to with its nickname "9-2-Light Edition" or short "9-2LE". The test set generates sampled values at a rate of 80 samples per cycle as intended for protection and metering applications. Nominal network frequencies of 50Hz and 60Hz are supported.
Application
The published sampled values correspond to analog voltages and currents generated by the test set. As the secondary values are still available if needed, hybrid applications are supported. The scaling of the primary values represented by the sampled values is done with the existing VT and CT settings from the Test Object. By this generic approach, all test modules of the OMICRON Test Universe can be used with sampled values.
Depending on the test set, up to three sampled value streams can be generated simultaneously from one test set. This supports testing applications that require more than one sampled value stream, such as synchrocheck or differential protection.
The sampled value function is available for the CMC 256plus, the CMC 356, and the CMC 256 with NET-1 Option.